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DATE
2008
IEEE
119views Hardware» more  DATE 2008»
14 years 2 months ago
Guiding Circuit Level Fault-Tolerance Design with Statistical Methods
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
Drew C. Ness, David J. Lilja
DATE
2003
IEEE
105views Hardware» more  DATE 2003»
14 years 28 days ago
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
Zaid Al-Ars, A. J. van de Goor, Jens Braun, Detlev...
SIGSOFT
2007
ACM
14 years 8 months ago
Fault and adversary tolerance as an emergent property of distributed systems' software architectures
Fault and adversary tolerance have become not only desirable but required properties of software systems because mission-critical systems are commonly distributed on large network...
Yuriy Brun, Nenad Medvidovic
DSN
2007
IEEE
14 years 2 months ago
Dependability Assessment of Grid Middleware
Dependability is a key factor in any software system due to the potential costs in both time and money a failure may cause. Given the complexity of Grid applications that rely on ...
Nik Looker, Jie Xu
PRDC
2007
IEEE
14 years 1 months ago
Assessment of Message Missing Failures in FlexRay-Based Networks
This paper assesses message missing failures in a FlexRay-based network. The assessment is based on about 35680 bit-flip fault injections inside different parts of the FlexRay com...
Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi...