—This paper shows that optical emissions from an operating chip have a good correlation with power traces and can therefore be used to estimate the contribution of different area...
The choice of error model used for robustness evaluation of Operating Systems (OSs) influences the evaluation run time, implementation complexity, as well as the evaluation preci...
Robustness is an important feature required for embedded systems. This paper presents a methodology to test robustness of such systems. We investigate system behaviour aspects. We...
Programmable logic arrays (PLAs) present an alternative to logic-gate based design. We propose the transistor level structure of a PLA for single-rail asynchronous applications. T...
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...