1459 search results - page 223 / 292 » Statistical Modeling for Circuit Simulation |
132
Voted
DSD
2008
IEEE
15 years 9 months ago
2008
IEEE
Abstract—In two recent contributions [1], [2], we have provided a comparative analysis of various optimization algorithms, which can be used for atomic location estimation, and s...
131
Voted
LCTRTS
2004
Springer
15 years 8 months ago
2004
Springer
Application specific instruction-set processors combine an efficient general purpose core with special purpose functionality that is tailored to a particular application domain. ...
118
Voted
ISLPED
2006
ACM
15 years 8 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
158
Voted
IJNS
2000
15 years 2 months ago
2000
An architecture is proposed for the realization of real-time edge-extraction filtering operation in an Address-Event-Representation (AER) vision system. Furthermore, the approach ...
147
Voted
TVLSI
2010
14 years 9 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...