1459 search results - page 39 / 292 » Statistical Modeling for Circuit Simulation |
ISBI
2008
IEEE
14 years 10 months ago
2008
IEEE
We propose a novel method for axonal bouton modeling and automated detection in populations of labeled neurons, as well as bouton distribution analysis for the study of neural cir...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
— State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated due to global source of variations and path r...
FTEDA
2006
13 years 10 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
TCAD
2010
13 years 4 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
A new approach in hierarchical optimisation is presented which is capable of optimising both the performance and yield of an analogue design. Performance and yield trade offs are ...