A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
This paper presents a Japanese information retrieval method using the dependency relationship between words and semantic and statistical information about them. Our method gives a...
Execution paths expose non-functional information such as system reliability and performance, which can be collected using runtime verification techniques. Statistics gathering an...
— Forward Error Correction (FEC) schemes are generally used in wireless communication systems to maintain an acceptable quality of service. Various models have been proposed in l...
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...