— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Background: Data from metabolomic studies are typically complex and high-dimensional. Principal component analysis (PCA) is currently the most widely used statistical technique fo...
Gift Nyamundanda, Lorraine Brennan, Isobel Claire ...
GISs give users facilities to integrate and analyze data from different sources with different scale, accuracy, resolution and quality of the original data which are the key aspect...
Rahim Ali. Abbaspour, Mahmoud Reza Delavar, Reihan...
Pointer analysis is traditionally performed once, early in the compilation process, upon an intermediate representation (IR) with source-code semantics. However, performing pointe...
Bolei Guo, Matthew J. Bridges, Spyridon Triantafyl...