685 search results - page 16 / 137 » Statistical analysis of sketch estimators |
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
ICPR
2008
IEEE
14 years 9 months ago
2008
IEEE
Geometric layout analysis plays an important role in document image understanding. Many algorithms known in literature work well on standard document images, achieving high text l...
ICC
2009
IEEE
14 years 3 months ago
2009
IEEE
—We present a detection scheme for multiple-symbol DPSK for use in a statistically unknown time-varying channel. The scheme relies on a parametric representation of the timevaryi...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ALMOB
2007
13 years 8 months ago
2007
Background: The optimal score for ungapped local alignments of infinitely long random sequences is known to follow a Gumbel extreme value distribution. Less is known about the imp...