In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
Geometric layout analysis plays an important role in document image understanding. Many algorithms known in literature work well on standard document images, achieving high text l...
Faisal Shafait, Joost van Beusekom, Daniel Keysers...
—We present a detection scheme for multiple-symbol DPSK for use in a statistically unknown time-varying channel. The scheme relies on a parametric representation of the timevaryi...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
Background: The optimal score for ungapped local alignments of infinitely long random sequences is known to follow a Gumbel extreme value distribution. Less is known about the imp...
Stefan Wolfsheimer, Bernd Burghardt, Alexander K. ...