17 search results - page 3 / 4 » Statistical design and optimization of SRAM cell for yield e... |
CODES
2010
IEEE
13 years 5 months ago
2010
IEEE
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
—Designing high-performance systems with high yield under parameter variations has raised serious design challenges in nanometer technologies. In this paper, we propose a profit-...
TIP
2008
13 years 7 months ago
2008
In this paper, we propose a hierarchical color correction algorithm for enhancing the color of digital images obtained from low quality digital image capture devices such as cell ...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...