5213 search results - page 118 / 1043 » Statistical entity-topic models |
ICCV
2003
IEEE
14 years 10 months ago
2003
IEEE
Many sensing techniques and image processing applications are characterized by noisy, or corrupted, image data. Anisotropic diffusion is a popular, and theoretically well understo...
DAC
2004
ACM
14 years 9 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...
ASPDAC
2006
ACM
14 years 2 months ago
2006
ACM
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...