5213 search results - page 119 / 1043 » Statistical entity-topic models |
CORR
1999
Springer
13 years 7 months ago
1999
Springer
: Integrating the outputs of multiple classifiers via combiners or meta-learners has led to substantial improvements in several difficult pattern recognition problems. In this arti...
ICCD
2007
IEEE
14 years 5 months ago
2007
IEEE
We have developed a new statistical timing analysis approach that does not impose any assumptions on the nature of manufacturing variability and takes into account an arbitrary mo...
CVPR
2007
IEEE
14 years 10 months ago
2007
IEEE
The proliferation of low-cost infrared cameras gives us a new angle for attacking many unsolved vision problems by leveraging a larger range of the electromagnetic spectrum. A fir...
HPCA
2003
IEEE
14 years 8 months ago
2003
IEEE
Due to cost, time, and flexibility constraints, simulators are often used to explore the design space when developing a new processor architecture, as well as when evaluating the ...
VTS
2000
IEEE
14 years 12 days ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...