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» Statistical gate sizing for timing yield optimization
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ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
14 years 4 months ago
Algorithms for MIS vector generation and pruning
Ignoring the effect of simultaneous switching for logic gates causes silicon failures for high performance microprocessor designs. The main reason to omit this effect is the run...
Kenneth S. Stevens, Florentin Dartu
TCAD
2010
164views more  TCAD 2010»
13 years 2 months ago
Advanced Variance Reduction and Sampling Techniques for Efficient Statistical Timing Analysis
The Monte-Carlo (MC) technique is a traditional solution for a reliable statistical analysis, and in contrast to probabilistic methods, it can account for any complicate model. How...
Javid Jaffari, Mohab Anis
DAC
1999
ACM
14 years 8 months ago
A Practical Gate Resizing Technique Considering Glitch Reduction for Low Power Design
We propose a method for power optimization that considers glitch reduction by gate sizing based on the statistical estimation of glitch transitions. Our method reduces not only th...
Masanori Hashimoto, Hidetoshi Onodera, Keikichi Ta...
DATE
2010
IEEE
134views Hardware» more  DATE 2010»
13 years 6 months ago
Combining optimizations in automated low power design
—Starting from sequential programs, we present an approach combining data reuse, multi-level MapReduce, and pipelining to automatically find the most power-efficient designs th...
Qiang Liu, Tim Todman, Wayne Luk
IOR
2008
109views more  IOR 2008»
13 years 7 months ago
Polynomial-Time Algorithms for Stochastic Uncapacitated Lot-Sizing Problems
In 1958, Wagner and Whitin published a seminal paper on the deterministic uncapacitated lot-sizing problem, a fundamental model that is embedded in many practical production plann...
Yongpei Guan, Andrew J. Miller