3 search results - page 1 / 1 » Statistical noise margin estimation for sub-threshold combin... |
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
ICCAD
1996
IEEE
14 years 23 days ago
1996
IEEE
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...