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» Statistical technology mapping for parametric yield
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CORR
2011
Springer
150views Education» more  CORR 2011»
13 years 2 months ago
Total variation regularization for fMRI-based prediction of behaviour
—While medical imaging typically provides massive amounts of data, the extraction of relevant information for predictive diagnosis remains a difficult challenge. Functional MRI ...
Vincent Michel, Alexandre Gramfort, Gaël Varo...
BMCBI
2008
105views more  BMCBI 2008»
13 years 8 months ago
Using the longest significance run to estimate region-specific p-values in genetic association mapping studies
Background: Association testing is a powerful tool for identifying disease susceptibility genes underlying complex diseases. Technological advances have yielded a dramatic increas...
Ie-Bin Lian, Yi-Hsien Lin, Ying-Chao Lin, Hsin-Cho...
DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
CIKM
2005
Springer
14 years 1 months ago
Opportunity map: a visualization framework for fast identification of actionable knowledge
Data mining techniques frequently find a large number of patterns or rules, which make it very difficult for a human analyst to interpret the results and to find the truly interes...
Kaidi Zhao, Bing Liu, Thomas M. Tirpak, Weimin Xia...
ASPDAC
2007
ACM
86views Hardware» more  ASPDAC 2007»
13 years 12 months ago
Fast Buffered Delay Estimation Considering Process Variations
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
Tien-Ting Fang, Ting-Chi Wang