65 search results - page 10 / 13 » Storage coding for wear leveling in flash memories |
EH
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper proposes an original approach to the reliability analysis for Embryonics [4], by introducing the accuracy threshold measure, borrowed from fault-tolerant quantum comput...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...
CLUSTER
2008
IEEE
14 years 2 months ago
2008
IEEE
—The increasing performance and decreasing cost of processors and memory are causing system intelligence to move from the CPU to peripherals such as disk drives. Storage system d...
HPCA
2012
IEEE
12 years 3 months ago
2012
IEEE
Phase change memory (PCM) recently has emerged as a promising technology to meet the fast growing demand for large capacity memory in modern computer systems. In particular, multi...
ASAP
2003
IEEE
14 years 25 days ago
2003
IEEE
At the Leiden Embedded Research Center, we are developing a compiler called Compaan that automatically translates signal processing applications written in Matlab into Kahn Proces...