— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
— Fast addition and multiplication are of paramount importance in many arithmetic circuits and processors. The use of redundant number system for efficient implementation of thes...
Sreehari Veeramachaneni, Kirthi M. Krishna, Lingam...
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
The integration of retiming and simultaneous supply/threshold voltage scaling has a potential to enable more rigorous total power reduction. However, such integration is a highly ...
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...