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ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
14 years 4 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
ISCAS
2007
IEEE
96views Hardware» more  ISCAS 2007»
14 years 4 months ago
Novel High-Speed Redundant Binary to Binary converter using Prefix Networks
— Fast addition and multiplication are of paramount importance in many arithmetic circuits and processors. The use of redundant number system for efficient implementation of thes...
Sreehari Veeramachaneni, Kirthi M. Krishna, Lingam...
ISCAS
2007
IEEE
132views Hardware» more  ISCAS 2007»
14 years 4 months ago
High Read Stability and Low Leakage Cache Memory Cell
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
Zhiyu Liu, Volkan Kursun
ISPD
2006
ACM
84views Hardware» more  ISPD 2006»
14 years 4 months ago
Integrated retiming and simultaneous Vdd/Vth scaling for total power minimization
The integration of retiming and simultaneous supply/threshold voltage scaling has a potential to enable more rigorous total power reduction. However, such integration is a highly ...
Mongkol Ekpanyapong, Sung Kyu Lim
DATE
2005
IEEE
127views Hardware» more  DATE 2005»
14 years 3 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...