This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
The search for encryption schemes that allow to evaluate functions (or circuits) over encrypted data has attracted a lot of attention since the seminal work on this subject by Rive...
Carlos Aguilar Melchor, Philippe Gaborit, Javier H...
3:2 counters and 4:2 compressors have been widely used for multiplier implementations. In this paper, a fast 5:3 compressor is derived for high-speed multiplier implementations. Th...
Ohsang Kwon, Kevin J. Nowka, Earl E. Swartzlander ...
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
Abstract--An efficient passivity test based on canonical projector techniques is proposed for descriptor systems (DSs) widely encountered in circuit and system modeling. The test f...