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113
Voted
VTS
2005
IEEE
95views Hardware» more  VTS 2005»
15 years 8 months ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...
157
Voted
HOTSWUP
2009
ACM
15 years 6 months ago
Efficient Systematic Testing for Dynamically Updatable Software
Recent years have seen significant advances in dynamic software updating (DSU) systems, which allow programs to be patched on the fly. However, a significant challenge remains: Ho...
Christopher M. Hayden, Eric A. Hardisty, Michael W...
126
Voted
ATS
2009
IEEE
127views Hardware» more  ATS 2009»
15 years 7 months ago
On the Generation of Functional Test Programs for the Cache Replacement Logic
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
Wilson J. Perez, Danilo Ravotto, Edgar E. Sá...
143
Voted
FMICS
2006
Springer
15 years 6 months ago
Model-Based Testing of a WAP Gateway: An Industrial Case-Study
Abstract. We present experiences from a case study where a model-based approach to black-box testing is applied to verify that a Wireless Application Protocol (WAP) gateway conform...
Anders Hessel, Paul Pettersson
109
Voted
ENTCS
2006
113views more  ENTCS 2006»
15 years 2 months ago
Concurrent Java Test Generation as a Search Problem
A Random test generator generates executable tests together with their expected results. In the form of a noise-maker, it seeds the program with conditional scheduling primitives ...
Yaniv Eytani