Structural testing is widely used in industrial verification processes of critical software. This report presents PathCrawler, a structural test generation tool that may be used ...
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya...
There has been little attention to search based test data generation in the presence of pointer inputs and dynamic data structures, an area in which recent concolic methods have e...
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...