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ISQED
2007
IEEE
120views Hardware» more  ISQED 2007»
14 years 5 months ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
ISOLA
2004
Springer
14 years 4 months ago
The Identification of registers in RTL Structures for the Test Application
Daniel Mika, Josef Strnadel, Kotásek Zdenik
WABI
2009
Springer
14 years 3 months ago
Predicting Gene Structures from Multiple RT-PCR Tests
Jakub Kovác, Tomás Vinar, Brona Brej...