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ISQED
2007
IEEE
120views Hardware» more  ISQED 2007»
16 years 1 months ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
ISOLA
2004
Springer
16 years 11 days ago
The Identification of registers in RTL Structures for the Test Application
Daniel Mika, Josef Strnadel, Kotásek Zdenik
WABI
2009
Springer
15 years 11 months ago
Predicting Gene Structures from Multiple RT-PCR Tests
Jakub Kovác, Tomás Vinar, Brona Brej...