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ATS
1998
IEEE
84views Hardware» more  ATS 1998»
15 years 6 months ago
A BIST Structure to Test Delay Faults in a Scan Environment
Patrick Girard, Christian Landrault, V. Moreda, Se...
BIRTHDAY
2004
Springer
15 years 6 months ago
An Algorithm for Testing Structure Freeness of Biomolecular Sequences
Satoshi Kobayashi, Takashi Yokomori, Yasubumi Saka...
DAGSTUHL
2007
15 years 3 months ago
Structural Sampling for Statistical Software Testing
Nicolas Baskiotis, Michèle Sebag