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ATS
1998
IEEE
84views Hardware» more  ATS 1998»
14 years 3 months ago
A BIST Structure to Test Delay Faults in a Scan Environment
Patrick Girard, Christian Landrault, V. Moreda, Se...
BIRTHDAY
2004
Springer
14 years 2 months ago
An Algorithm for Testing Structure Freeness of Biomolecular Sequences
Satoshi Kobayashi, Takashi Yokomori, Yasubumi Saka...
DAGSTUHL
2007
14 years 18 days ago
Structural Sampling for Statistical Software Testing
Nicolas Baskiotis, Michèle Sebag