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    1998
    IEEE
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    A BIST Structure to Test Delay Faults in a Scan Environment

    14 years 3 months ago
    A BIST Structure to Test Delay Faults in a Scan Environment
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    Patrick Girard, Christian Landrault, V. Moreda, Se
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    Added 04 Aug 2010
    Updated 04 Aug 2010
    Type Conference
    Year 1998
    Where ATS
    Authors Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel
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