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32

ATS
1998
IEEE

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A BIST Structure to Test Delay Faults in a Scan Environment

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A BIST Structure to Test Delay Faults in a Scan Environment

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Patrick Girard, Christian Landrault, V. Moreda, Se

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ATS 1998 | Hardware |

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1998
Where	ATS
Authors	Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel

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