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118
Voted
DFT
2006
IEEE
15 years 8 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
138
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ISVLSI
2003
IEEE
15 years 7 months ago
2003
IEEE
The need for small, high speed, low power computers as the end of Moore’s law approaches is driving research into nanotechnology. These novel devices have significantly differe...
118
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IV
2002
IEEE
15 years 7 months ago
2002
IEEE
We propose ‘Trace View’, a static visualization method for monitoringand debugging the dynamic behavior of programs written in data flow visual programming languages. Trace V...
111
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TAICPART
2006
IEEE
15 years 8 months ago
2006
IEEE
One of the key roles of any information system is to enforce the business rules and policies set by the owning organisation. As for any important functionality, it is necessary to...
130
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ISSTA
2009
ACM
15 years 9 months ago
2009
ACM
Metamorphic testing has been shown to be a simple yet effective technique in addressing the quality assurance of applications that do not have test oracles, i.e., for which it is ...