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DATE
2009
IEEE
167views Hardware» more  DATE 2009»
14 years 3 months ago
Analyzing the impact of process variations on parametric measurements: Novel models and applications
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
Sherief Reda, Sani R. Nassif
CIMCA
2008
IEEE
14 years 3 months ago
A Clustering Based Denoising Technique for Range Images of Time of Flight Cameras
A relatively new technique for measuring the 3D structure of visual scenes is provided by time of flight (TOF) cameras. Reflections of modulated light waves are recorded by a pa...
Holger Schöner, Bernhard Moser, Adrian A. Dor...
ICASSP
2008
IEEE
14 years 3 months ago
Hierarchical lane detection for different types of roads
This paper presents a hierarchical lane detection system with the ability to deal with both structured and unstructured roads. The proposed system classifies the environment first...
Hsu-Yung Cheng, Chih-Chang Yu, Chien-Cheng Tseng, ...
ICPR
2008
IEEE
14 years 3 months ago
Parameter-based reduction of Gaussian mixture models with a variational-Bayes approach
This paper 1 proposes a technique for simplifying a given Gaussian mixture model, i.e. reformulating the density in a more parcimonious manner, if possible (less Gaussian componen...
Pierrick Bruneau, Marc Gelgon, Fabien Picarougne
ISLPED
2006
ACM
119views Hardware» more  ISLPED 2006»
14 years 2 months ago
Process variation aware cache leakage management
In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a...
Ke Meng, Russ Joseph