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TVLSI
2010
13 years 4 months ago
Pattern Sensitive Placement Perturbation for Manufacturability
The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
Shiyan Hu, Patrik Shah, Jiang Hu
VLSI
2010
Springer
13 years 4 months ago
SESAM extension for fast MPSoC architectural exploration and dynamic streaming applications
Future systems will have to support multiple and concurrent dynamic compute-intensive applications, while respecting real-time and energy consumption constraints. To overcome these...
Nicolas Ventroux, Tanguy Sassolas, Raphael David, ...
EUROSYS
2011
ACM
13 years 1 months ago
Symbolic crosschecking of floating-point and SIMD code
We present an effective technique for crosschecking an IEEE 754 floating-point program and its SIMD-vectorized version, implemented in KLEE-FP, an extension to the KLEE symbolic ...
Peter Collingbourne, Cristian Cadar, Paul H. J. Ke...
CCS
2011
ACM
12 years 9 months ago
Trace equivalence decision: negative tests and non-determinism
We consider security properties of cryptographic protocols that can be modeled using the notion of trace equivalence. The notion of equivalence is crucial when specifying privacy-...
Vincent Cheval, Hubert Comon-Lundh, Stéphan...
POST
2012
218views more  POST 2012»
12 years 5 months ago
A Core Calculus for Provenance
Provenance is an increasing concern due to the revolution in sharing and processing scientific data on the Web and in other computer systems. It is proposed that many computer sys...
Umut A. Acar, Amal Ahmed, James Cheney, Roly Perer...
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