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» Support for Object-Oriented Testing
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VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
16 years 3 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
MTV
2005
IEEE
101views Hardware» more  MTV 2005»
15 years 8 months ago
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
Paolo Bernardi, Michelangelo Grosso, Maurizio Reba...
APSEC
2000
IEEE
15 years 6 months ago
A GUI and testing tool for SOFL
SOFL is a formal language and method for system specification and design. As a language it is an integration of Petri nets, Data Flow Diagrams, and VDM-SL. As a method it is a com...
Shaoying Liu, Tetsuo Fukuzaki, Koji Miyamoto
116
Voted
ATAL
2008
Springer
15 years 4 months ago
Automated unit testing intelligent agents in PDT
The Prometheus Design Tool (PDT) is an agent development tool that supports the Prometheus design methodology and includes features like automated code generation. We enhance this...
Zhiyong Zhang, John Thangarajah, Lin Padgham
CBMS
2009
IEEE
15 years 9 months ago
Inferring grant support types from online biomedical articles
The category of institution or organization underwriting the research reported in a scientific article is a required field (Grant Support type) in the bibliographic record of that...
Jongwoo Kim, Daniel X. Le, George R. Thoma