In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
Kedarnath J. Balakrishnan, Nur A. Touba, Srinivas ...
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
Michael J. Knieser, Francis G. Wolff, Christos A. ...
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...