327 search results - page 49 / 66 » Symbolic Fault Injection |
FDTC
2009
Springer
14 years 2 months ago
2009
Springer
—This paper shows that optical emissions from an operating chip have a good correlation with power traces and can therefore be used to estimate the contribution of different area...
DSN
2007
IEEE
14 years 1 months ago
2007
IEEE
The choice of error model used for robustness evaluation of Operating Systems (OSs) influences the evaluation run time, implementation complexity, as well as the evaluation preci...
SERA
2007
Springer
14 years 1 months ago
2007
Springer
Robustness is an important feature required for embedded systems. This paper presents a methodology to test robustness of such systems. We investigate system behaviour aspects. We...
DSD
2006
IEEE
14 years 1 months ago
2006
IEEE
Programmable logic arrays (PLAs) present an alternative to logic-gate based design. We propose the transistor level structure of a PLA for single-rail asynchronous applications. T...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...