171 search results - page 9 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
CORR
2010
Springer
13 years 9 months ago
2010
Springer
A Transaction database contains a set of transactions along with items and their associated timestamps. Transitional patterns are the patterns which specify the dynamic behavior o...
CVPR
2003
IEEE
14 years 11 months ago
2003
IEEE
A new algorithm is proposed for removing large objects from digital images. The challenge is to fill in the hole that is left behind in a visually plausible way. In the past, this...
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
INTEGRATION
2006
13 years 9 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...