151 search results - page 8 / 31 » Systematic test program generation for SoC testing using emb... |
VEE
2012
ACM
12 years 3 months ago
2012
ACM
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
ISQED
2002
IEEE
14 years 24 days ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
JAVACARD
2000
13 years 11 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
TCAD
2008
13 years 7 months ago
2008
Abstract--For modern embedded systems in the realm of highthroughput multimedia, imaging, and signal processing, the complexity of embedded applications has reached a point where t...
CSREAESA
2009
13 years 9 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...