151 search results - page 8 / 31 » Systematic test program generation for SoC testing using emb... |
170
Voted
VEE
2012
ACM
13 years 9 months ago
2012
ACM
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
142
Voted
ISQED
2002
IEEE
15 years 7 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
171
Voted
JAVACARD
2000
15 years 5 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
130
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TCAD
2008
15 years 2 months ago
2008
Abstract--For modern embedded systems in the realm of highthroughput multimedia, imaging, and signal processing, the complexity of embedded applications has reached a point where t...
152
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CSREAESA
2009
15 years 3 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...