Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Many scenarios involve merging of two B-tree indexes, both covering the same key range. Increasing demand for continuous availability and high performance requires that such mergi...
Xiaowei Sun, Rui Wang 0002, Betty Salzberg, Chendo...
Prediction of fault prone software components is one of the most researched problems in software engineering. Many statistical techniques have been proposed but there is no consen...
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
Sybille Hellebrand, Christian G. Zoellin, Hans-Joa...
Dwell time on Web pages has been extensively used for various information retrieval tasks. However, some basic yet important questions have not been sufficiently addressed, e.g., ...