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DATE
2007
IEEE
106views Hardware» more  DATE 2007»
14 years 4 months ago
Low-cost protection for SER upsets and silicon defects
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kyp...
SIGMOD
2005
ACM
74views Database» more  SIGMOD 2005»
14 years 10 months ago
Online B-tree Merging
Many scenarios involve merging of two B-tree indexes, both covering the same key range. Increasing demand for continuous availability and high performance requires that such mergi...
Xiaowei Sun, Rui Wang 0002, Betty Salzberg, Chendo...
ISSRE
2008
IEEE
14 years 4 months ago
Cost Curve Evaluation of Fault Prediction Models
Prediction of fault prone software components is one of the most researched problems in software engineering. Many statistical techniques have been proposed but there is no consen...
Yue Jiang, Bojan Cukic, Tim Menzies
DFT
2007
IEEE
105views VLSI» more  DFT 2007»
14 years 4 months ago
A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
Sybille Hellebrand, Christian G. Zoellin, Hans-Joa...
SIGIR
2010
ACM
14 years 2 months ago
Understanding web browsing behaviors through Weibull analysis of dwell time
Dwell time on Web pages has been extensively used for various information retrieval tasks. However, some basic yet important questions have not been sufficiently addressed, e.g., ...
Chao Liu, Ryen W. White, Susan T. Dumais