353 search results - page 14 / 71 » TRICS: A Testing Tool for C |
KBSE
2010
IEEE
13 years 6 months ago
2010
IEEE
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
ECCC
2011
13 years 2 months ago
2011
Polynomial identity testing (PIT) problem is known to be challenging even for constant depth arithmetic circuits. In this work, we study the complexity of two special but natural ...
GECCO
2005
Springer
14 years 1 months ago
2005
Springer
As the paradigm of object orientation becomes more and more important for modern IT development projects, the demand for an automated test case generation to dynamically test obje...
VIZSEC
2004
Springer
14 years 1 months ago
2004
Springer
This paper examines the dramatic visual fingerprints left by a wide variety of popular network attack tools in order to better understand the specific methodologies used by attack...
ISCAS
1999
IEEE
13 years 12 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...