1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
Most algorithms for computing diagnoses within a modelbased diagnosis framework are deterministic. Such algorithms guarantee soundness and completeness, but are NPhard. To overcom...
Alexander Feldman, Gregory M. Provan, Arjan J. C. ...
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
-- Design of non-uniform linear antenna arrays is one of the most important electromagnetic optimization problems of current interest. In this article, an adaptive Differential Evo...