Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
Abstract. In this paper, we propose a hybrid genetic algorithm for partitioning a VLSI circuit graph into two disjoint graphs of minimum cut size. The algorithm includes a local op...
Operation management of underground passenger transport systems is associated with combinatorial optimization problems (known as crew and train scheduling and rostering) which bel...
As the operating frequency increases to Giga Hertz and the rise time of a signal is less than or comparable to the time-of-flight delay of a line, it is necessary to consider the...