78 search results - page 13 / 16 » Tabu Search Based Circuit Optimization |
130
click to vote
VTS
1997
IEEE
15 years 7 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
134
Voted
VLSID
1993
IEEE
15 years 7 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
115
Voted
GECCO
2003
Springer
15 years 8 months ago
2003
Springer
Abstract. In this paper, we propose a hybrid genetic algorithm for partitioning a VLSI circuit graph into two disjoint graphs of minimum cut size. The algorithm includes a local op...
172
Voted
HEURISTICS
2010
14 years 10 months ago
2010
Operation management of underground passenger transport systems is associated with combinatorial optimization problems (known as crew and train scheduling and rostering) which bel...
116
click to vote
ICCD
2001
IEEE
16 years 14 days ago
2001
IEEE
As the operating frequency increases to Giga Hertz and the rise time of a signal is less than or comparable to the time-of-flight delay of a line, it is necessary to consider the...