547 search results - page 19 / 110 » Teaching with technology, setting an example |
TVLSI
2008
13 years 7 months ago
2008
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip caches, due to the high complexity of memory tests and to the large amount of transis...
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
IJMSO
2007
13 years 7 months ago
2007
This paper describes work in progress developing a context-aware meeting alert. This application integrates semantic web technology in RDF (for representing calendars), semantic we...
WWW
2004
ACM
14 years 8 months ago
2004
ACM
In the problem of learning with positive and unlabeled examples, existing research all assumes that positive examples P and the hidden positive examples in the unlabeled set U are...
VLDB
2004
ACM
14 years 1 months ago
2004
ACM
This presentation will discuss several database technology challenges that are faced when building a data warehouse. It will touch on the challenges posed by high capacity drives ...