176 search results - page 11 / 36 » Techniques for Functional Test Pattern Execution |
GLVLSI
2006
IEEE
14 years 2 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
ETS
2006
IEEE
14 years 2 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ICCD
2006
IEEE
14 years 5 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
BMCBI
2006
13 years 8 months ago
2006
Background: Periodic processes, such as the circadian rhythm, are important factors modulating and coordinating transcription of genes governing key metabolic pathways. Theoretica...
ISSRE
2006
IEEE
14 years 2 months ago
2006
IEEE
—Graphical user interfaces (GUIs) are used as front ends to most of today’s software applications. The event-driven nature of GUIs presents new challenges for testing. One impo...