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TVCG
2011
13 years 2 months ago
2011
— The growing sizes of volumetric data sets pose a great challenge for interactive visualization. In this paper, we present a feature-preserving data reduction and focus+context ...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 2 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
VTS
2003
IEEE
14 years 24 days ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...