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» Test Automation Meets Static Analysis
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DSN
2009
IEEE
14 years 2 months ago
LFI: A practical and general library-level fault injector
Fault injection, a critical aspect of testing robust systems, is often overlooked in the development of generalpurpose software. We believe this is due to the absence of easy-to-u...
Paul Dan Marinescu, George Candea
VLSID
2006
IEEE
183views VLSI» more  VLSID 2006»
14 years 1 months ago
Design Challenges for High Performance Nano-Technology
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
Goutam Debnath, Paul J. Thadikaran
ISSTA
2009
ACM
14 years 2 months ago
HAMPI: a solver for string constraints
Many automatic testing, analysis, and verification techniques for programs can be effectively reduced to a constraint-generation phase followed by a constraint-solving phase. Th...
Adam Kiezun, Vijay Ganesh, Philip J. Guo, Pieter H...
OSDI
2008
ACM
14 years 8 months ago
Gadara: Dynamic Deadlock Avoidance for Multithreaded Programs
Deadlock is an increasingly pressing concern as the multicore revolution forces parallel programming upon the average programmer. Existing approaches to deadlock impose onerous bu...
Manjunath Kudlur, Scott A. Mahlke, Stéphane...
FMICS
2009
Springer
14 years 2 months ago
Towards an Industrial Use of FLUCTUAT on Safety-Critical Avionics Software
Most modern safety-critical control programs, such as those embedded in fly-by-wire control systems, perform a lot of floating-point computations. The well-known pitfalls of IEEE...
David Delmas, Eric Goubault, Sylvie Putot, Jean So...