249 search results - page 13 / 50 » Test Coverage Analysis and Preservation for Requirements-Bas... |
130
Voted
VTS
2002
IEEE
15 years 8 months ago
2002
IEEE
This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
133
click to vote
ISSRE
2010
IEEE
15 years 1 months ago
2010
IEEE
—Database-centric applications (DCAs) are common in enterprise computing, and they use nontrivial databases. Testing of DCAs is increasingly outsourced to test centers in order t...
112
Voted
ITC
1994
IEEE
15 years 7 months ago
1994
IEEE
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
105
click to vote
DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
122
click to vote
ADAEUROPE
1997
Springer
15 years 7 months ago
1997
Springer
The systematic test is an inevitable part of the verification and validation process for software. Overall support for all testing activities is currently not available in a singl...