249 search results - page 13 / 50 » Test Coverage Analysis and Preservation for Requirements-Bas... |
VTS
2002
IEEE
14 years 13 days ago
2002
IEEE
This paper presents a procedure for modifying a given set of scan vectors so that the peak power during scan testing is kept below a specified limit without reducing fault coverag...
ISSRE
2010
IEEE
13 years 6 months ago
2010
IEEE
—Database-centric applications (DCAs) are common in enterprise computing, and they use nontrivial databases. Testing of DCAs is increasingly outsourced to test centers in order t...
ITC
1994
IEEE
13 years 11 months ago
1994
IEEE
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
ADAEUROPE
1997
Springer
13 years 11 months ago
1997
Springer
The systematic test is an inevitable part of the verification and validation process for software. Overall support for all testing activities is currently not available in a singl...