249 search results - page 29 / 50 » Test Coverage Analysis and Preservation for Requirements-Bas... |
ICCV
2003
IEEE
14 years 9 months ago
2003
IEEE
Previous works have demonstrated that the face recognition performance can be improved significantly in low dimensional linear subspaces. Conventionally, principal component analy...
ICSM
2002
IEEE
14 years 16 days ago
2002
IEEE
The Object Relation Diagram (ORD) of a program is a class interdependence diagram which has applications in a wide variety of software engineering problems (e.g., integration test...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
VLSID
2001
IEEE
14 years 8 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
STVR
2010
13 years 6 months ago
2010
Failures triggered by hard to debug defects usually involve complex interactions between many program elements. We hypothesize that information flows present a good model for such ...