249 search results - page 30 / 50 » Test Coverage Analysis and Preservation for Requirements-Bas... |
ATVA
2004
Springer
14 years 1 months ago
2004
Springer
Timed Bisimulation Preserving Abstraction for Parametric Time-Interval Automata Akio Nakata, Tadaaki Tanimoto, Suguru Sasaki, Teruo Higashino Department of Information Networking, ...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
ICCAD
1996
IEEE
13 years 11 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
RECOMB
2005
Springer
14 years 8 months ago
2005
Springer
: A series of genome-scale algorithms and high-performance implementations is described and shown to be useful in the genetic analysis of gene transcription. With them it is possib...
PASTE
2004
ACM
14 years 1 months ago
2004
ACM
Many software testing and automated debugging tools rely on structural coverage techniques. Such tools implicitly assume a relation between individual control-flow choices made i...