532 search results - page 4 / 107 » Test Data Compression: The System Integrator's Perspective |
ISVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
Re-using the network in a NoC-based system as a test access mechanism is an attractive solution as pointed out by several authors. As a consequence, testing of NoC-based SoCs is b...
HICSS
2003
IEEE
13 years 12 months ago
2003
IEEE
Testing can be difficult to integrate into software development. Approaches to software testing in relation to implementing software are based on the V-model of testing. The softw...
EMSOFT
2009
Springer
14 years 1 months ago
2009
Springer
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...
HICSS
2008
IEEE
14 years 1 months ago
2008
IEEE
Soft innovations are regarded as insightful, useful ideas originating from stakeholders within the organization. This study takes a new approach to examining the origins of soft i...
DATE
2009
IEEE
13 years 10 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...