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127
Voted
AAECC
1999
Springer
15 years 3 months ago
1999
Springer
Effective quantifier elimination procedures for the reals allow to solve problems that can be encoded into corresponding first-order formulas including ordering constraints. In con...
100
Voted
ATS
2009
IEEE
15 years 10 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
145
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
118
Voted
VTS
1996
IEEE
15 years 7 months ago
1996
IEEE
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
114
Voted
ITC
1994
IEEE
15 years 7 months ago
1994
IEEE
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...