203 search results - page 24 / 41 » Test Generation and Fault Localization for Quantum Circuits |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
VLSID
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...