203 search results - page 32 / 41 » Test Generation and Fault Localization for Quantum Circuits |
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
VTS
2000
IEEE
13 years 12 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...