1016 search results - page 158 / 204 » Test Generation for Designs with On-Chip Clock Generators |
IDEAS
2003
IEEE
14 years 2 months ago
2003
IEEE
With the wide development of databases in general and data warehouses in particular, it is important to reduce the tasks that a database administrator must perform manually. The a...
FTCS
1998
13 years 10 months ago
1998
Programs fail mainly for two reasons: logic errors in the code, and exception failures. Exception failures can account for up to 2/3 of system crashes [6], hence are worthy of ser...
TCAD
2002
13 years 8 months ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...
TCSV
2010
13 years 3 months ago
2010
Evaluating the perceptual quality of video is of tremendous importance in the design and optimization of wireless video processing and transmission systems. In an endeavor to emula...
DDECS
2007
IEEE
14 years 3 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...