1016 search results - page 27 / 204 » Test Generation for Designs with On-Chip Clock Generators |
DATE
2000
IEEE
14 years 2 days ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ET
2000
13 years 7 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
FMCO
2008
Springer
13 years 9 months ago
2008
Springer
Abstract. This paper presents a unified approach to test case generation and conformance test execution in a distributed setting. A model in the object-oriented, concurrent modelin...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...
JSW
2007
13 years 7 months ago
2007
— BPEL (Business Process Execution Language) as a de-facto standard for web service orchestration has drawn particularly attention from researchers and industries. BPEL is a semi...