1016 search results - page 28 / 204 » Test Generation for Designs with On-Chip Clock Generators |
VTS
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
ET
1998
13 years 7 months ago
1998
Defining information required by automatic test systems frequently involves a description of system behavior. To facilitate capturing the required behavior information in the cont...
CHI
2005
ACM
14 years 8 months ago
2005
ACM
Software systems are often complex in the number of features that are available through the user interface and consequently, the number of interactions that can occur. Such system...
ICSE
1999
IEEE-ACM
13 years 12 months ago
1999
IEEE-ACM
The widespread use of GUIs for interacting with software is leading to the construction of more and more complex GUIs. With the growing complexity comes challenges in testing the ...