1016 search results - page 45 / 204 » Test Generation for Designs with On-Chip Clock Generators |
117
Voted
ICCD
2006
IEEE
16 years 20 days ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
92
Voted
ICRA
2006
IEEE
15 years 9 months ago
2006
IEEE
Today’s aerial robots are being tasked to fly in nearEarth environments such as caves, forests and buildings. The lack of flight data and performance metrics poses a gap that ...
155
Voted
ICSEA
2007
IEEE
15 years 10 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
117
Voted
WSC
2004
15 years 5 months ago
2004
An interactive tool has been developed for visualizing and creating scaled battlefield based scenarios for use in a simulation testbed to develop and test distributed data fusion ...
125
Voted
ICALT
2007
IEEE
15 years 10 months ago
2007
IEEE
In this study, we design and prototype an automatic quiz generation system (auto-quiz for short) for a given English text to test learner comprehension of text content and English...