1016 search results - page 71 / 204 » Test Generation for Designs with On-Chip Clock Generators |
ISPD
1997
ACM
13 years 12 months ago
1997
ACM
- This paper reports on a highly effective methodology to construct complex high performance microprocessors. Critical aspects of the methodology include an integrated database for...
ISCAS
1994
IEEE
13 years 12 months ago
1994
IEEE
This paper presents a novel VLSI architecture for high-speed data compressor designs which implement the well-known LZ77 algorithm. The architecture mainly consists of three units...
CL
2010
Springer
13 years 7 months ago
2010
Springer
In this paper we present the syntax, semantics, and compilation of a new system-level programming language called SystemJ. SystemJ is a multiclock language supporting the Globally...
ISLPED
1995
ACM
13 years 11 months ago
1995
ACM
The need to reduce the power consumption of the next generation of digital systems is clearly recognized. At the system level, power management is a very powerful technique and de...
ICSE
2009
IEEE-ACM
14 years 2 months ago
2009
IEEE-ACM
Developers use unit testing to improve the quality of software systems. Current development tools for unit testing help to automate test execution, to report results, and to gener...