A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
Abstract. Model-based testing (MBT) seems to be technically superior to conventional test automation. However, MBT features some difficulties that can hamper its deployment in indu...
Model-based software has become quite popular in recent years, making its way into a broad range of areas, including the aerospace industry. The models provide an easy graphical i...
We present a model-driven approach to the segmentation of nasal cavity and paranasal sinus boundaries. Based on computed tomography data of a patients head, our approach aims to ex...
Carsten Last, Simon Winkelbach, Friedrich M. Wahl,...
This paper presents a new approach for diagnosing stuck-at and short faults in interconnects whose layouts are known. This structural approach exploits dierent graph coloring and ...